OSDN Git Service

(root) / android-x86 / kernel.git / commit
? search:
summary | shortlog | log | commit | commitdiff | tree
(parent: 49bd196) | patch
USB: ark3116: remove bogus disconnect test in close
authorJohan Hovold <jhovold@gmail.com>
Thu, 21 Mar 2013 11:36:28 +0000 (12:36 +0100)
committerGreg Kroah-Hartman <gregkh@linuxfoundation.org>
Mon, 25 Mar 2013 20:44:17 +0000 (13:44 -0700)
commit5c3275282422dcb895e2e9902c7fba4fd9d2512b
treec65f8f2d54d17604ad6ca1cfdb3acda0f0bbee48tree | snapshot
parent49bd196dc651606e2f97f42957f9fcde3186f615commit | diff
USB: ark3116: remove bogus disconnect test in close

Remove bogus (and unnecessary) test for serial->dev being NULL in close.

The device is never cleared, and close is never called after a completed
disconnect anyway.

Signed-off-by: Johan Hovold <jhovold@gmail.com>
Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
drivers/usb/serial/ark3116.c diff | blob | history
kernel
About OSDN
Find Software
Develop Software
Help