From a7e0b57e8637ff0f5c37629a051745bb5979678c Mon Sep 17 00:00:00 2001
From: Mathieu Chartier <mathieuc@google.com>
Date: Tue, 24 Jan 2017 14:48:24 -0800
Subject: [PATCH] Disable test 154 for GC stress

GC stress does too many GCs and may cause the test to fail.

Test: test-art-host -j32 ART_TEST_GC_STRESS=true ART_TEST_INTERPRETER=tru

Change-Id: I7a46d185b718a3faaa74dbc561506e4844b79032
---
 test/Android.run-test.mk | 1 +
 1 file changed, 1 insertion(+)

diff --git a/test/Android.run-test.mk b/test/Android.run-test.mk
index 5bb39fe09..cb798f049 100644
--- a/test/Android.run-test.mk
+++ b/test/Android.run-test.mk
@@ -379,6 +379,7 @@ TEST_ART_BROKEN_INTERPRETER_ACCESS_CHECK_TESTS :=
 #   slows down allocations significantly which these tests do a lot.
 TEST_ART_BROKEN_GCSTRESS_RUN_TESTS := \
   137-cfi \
+  154-gc-loop \
   908-gc-start-finish \
   913-heaps \
   961-default-iface-resolution-gen \
-- 
2.11.0