tests: use "compare exp out", not "compare out exp"

[android-x86/external-parted.git] / tests / t0207-IEC-binary-notation.sh

diff --git a/tests/t0207-IEC-binary-notation.sh b/tests/t0207-IEC-binary-notation.sh
index 343b8c1..b85ca65 100644 (file)
--- a/tests/t0207-IEC-binary-notation.sh
+++ b/tests/t0207-IEC-binary-notation.sh
@@ -25,16 +25,16 @@ dev=dev-file
 dd if=/dev/null of=$dev bs=$ss seek=$n_sectors || fail=1
 parted --align=none -s $dev mklabel gpt mkpart p1 $((64*1024))B $((1024*1024-$ss))B \
     > err 2>&1 || fail=1
-compare err /dev/null || fail=1
+compare /dev/null err || fail=1
 parted -m -s $dev u s p > exp || fail=1
 
 rm $dev
 dd if=/dev/null of=$dev bs=$ss seek=$n_sectors || fail=1
 parted --align=none -s $dev mklabel gpt mkpart p1 64KiB 1MiB \
     > err 2>&1 || fail=1
-compare err /dev/null || fail=1
+compare /dev/null err || fail=1
 parted -m -s $dev u s p > out || fail=1
 
-compare out exp || fail=1
+compare exp out || fail=1
 
 Exit $fail